Engineering Innovation in Electronic Prognostics

Sentinel Software

PDKChipChek

  • Self-testing structures on-chip (minimal area)
  • Accurate and precise measurement of:
    • Turn-on current ION for N- and P-type (defined for VGS=VDS/2)
    • Resistance (body and end sheet) for poly
  • Easy and quick to measure
  • Requires minimal external equipment
  • Extracts exact fluctuations for application and biasing

 

 

 

 

Fabless Semiconductor
Design House?

Was it a design problem or a process/foundry problem?

Ridgetop's PDKChek© die-level test structure provides independent verification of foundry-supplied parameters.

Process-aware designs?

Ridgetop's PDKChek provides in-situ measurements to correct for parametric variations in the die, improving production yields and major savings!

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