Compact Wafer-level Reliability Systems

Ridgetop Wafer Testing Qualification

 

ProChek can be used in a variety of ways, depending on your application. The graphic below shows the flexibility of the system to meet a range of needs.

ProChek system graphic

ProChek system – click to enlarge

Using Standard Test Structures

Despite its amazingly compact form factor, ProChek incorporates multiple SMUs, effectively replacing racks of test and measurement equipment and floor-space-eating automated test equipment (ATE). As a result, it is well-suited for wafer-level reliability (WLR) and package-level reliability applications using your existing or newly designed test structures.

Q-Star Test Systems

Q-Star Test is a complete line of affordable precision current measurement modules and intellectual property (IP) for IC testing that:

  • Reduces test time and test cost
  • Improves product quality
  • Improves test quality
  • Accelerates failure analysis

Ridgetop Europe develops and supports the Q-Star Test product line for IDDQ/ISSQ/IDDT and other test methodologies. With successful installations in the semiconductor, automotive, medical control, telecommunications, networking, sensors and transducers, and consumer electronics markets, Q-Star Test products and services can help you bring together the worlds of design and test and properly implement current-based test strategies while saving you time and money.

The Q-Star Test product line covers:

The Q-Star Test™ Product Brief provides a summary of the information below.