Q-Star Test is a complete line of affordable precision current measurement modules and intellectual property (IP) for IC testing that:
- Reduces test time and test cost
- Improves product quality
- Improves test quality
- Accelerates failure analysis
Ridgetop Europe develops and supports the Q-Star Test product line for IDDQ/ISSQ/IDDT and other test methodologies. With successful installations in the semiconductor, automotive, medical control, telecommunications, networking, sensors and transducers, and consumer electronics markets, Q-Star Test products and services can help you bring together the worlds of design and test and properly implement current-based test strategies while saving you time and money.
The Q-Star Test product line covers:
- IDDQ/ISSQ Applications
- IDDT Applications
- Analog Current Measurement Applications
- Built-in Current Sensors
The Q-Star Test™ Product Brief provides a summary of the information below.
- QD-1011-HC: Advanced High Current Iddq, Measurement Instrument Supporting Various Test Applications
- QD-1011-HCLite; Wide Range, High Current, High Performance Digital Iddq, Measurement Instrument
- QD-1011: Advanced (Delta) Iddq Measurement Instrument Supporting Various Test Applications
- QD-1011Lite; High Speed, High Resolution Digital Iddq Measurement Instrument
- QD-1013; Advanced High Voltage Iddq Instrument Supporting Various Test Applications
- QD-1020-HC: Advanced High Current Multi-site Iddq Measurement Instrument Supporting Various Test Applications
- QD-1020; Advanced Multi-site Iddq Measurement Instrument Supporting Various Test Applications
- QD-1030; Advanced (Delta) Issq Measurement Instrument Supporting Various Test Applications
- QD-1040; Advanced Iddq Instrument with Sense Line Control Supporting Various Measurement Approaches
- QT-1411: Advanced Dynamic /Transient (IDDT) Supply Current Measurement Instrument
Analog Current Measurement Applications
- QA-1000-HC: Configurable Analog Supply/Ground Current Measurement Instruments
- QA-1000: Configurable Analog Supply Current Measurement Instrument
Built-in Current Sensors
- BICMON: Full Featured Built-in CMOS IDDQ Monitor Core
- PG-Mon: Built-in CMOS Monitor Core for IC Connection Verification
- Reliability and Precision Current Measurements
- For information on how PG-Mon is used for monitoring reliability of 2.5D and 3D stacked ICs, visit the TSV BIST™ page.
- ProChek™ includes similar Q-Star-class instruments in a highly integrated system.