Why do you need Ridgetop die-level test structures?
We provide in-situ measurement solutions for IC applications.
When you can monitor
key parameter variation and performance degradation, you
can take corrective or preventive action much faster and more
easily.
Fabless Semiconductor
Design House
Was it a design problem or a process/foundry problem?
Ridgetop’s PDKChek® die-level test structure provides independent verification of foundry-supplied parameters.
Process-aware designs
Ridgetop’s PDKChek provides in-situ measurements to correct for parametric variations in the die, improving production yields and major savings!
Customer Service
Reach our staff from 8:00AM to 5:00PM (MST).
520-742-3300 (p)
520-544-3180 (f)