MEMS Tech™

MEMS Accelerometer

Download MEMS Accelerometer Technology Brief

Ridgetop Group has leveraged its work on several related DOD and NASA contract awards to develop a first silicon prototype of an integrated MEMS capacitive accelerometer on a CMOS die. The innovative low temperature MEMS deposition post-processing step lowers the cost of development as no changes to the CMOS process flow are required.



The sensor is part of the broader development plan for a generic sensor interface chip (GSIC) architecture that is able to accept input from a variety of transducers. The chip comprises a smart sensor interface with on-chip signal conditioning, analog-to-digital conversion, data reduction and DSP, and wireless connectivity. The image below shows a system-level representation of the Ridgetop MEMS Sensor.

Why do you need Ridgetop die-level test structures?

We provide in-situ measurement solutions for IC applications. When you can monitor key parameter variation and performance degradation, you can take corrective or preventive action much faster and more easily.

Fabless Semiconductor
Design House

Was it a design problem or a process/foundry problem?

Ridgetop’s PDKChek® die-level test structure provides independent verification of foundry-supplied parameters.

Process-aware designs

Ridgetop’s PDKChek provides in-situ measurements to correct for parametric variations in the die, improving production yields and major savings!

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