Accustomed to pioneering innovative electronic technology and establishing engineering milestones, Mr. Goodman’s comprehensive background encompasses low-noise instrumentation, design-for-test (DFT), fault simulation techniques, and design tool development at established firms such as Tektronix and Honeywell. This innovative mindset was integral to the development of the first DSP-based IF processing for spectral analyzers, of which he was a leading team member in its creation.
Mr. Goodman successfully steered engineering at Analogy Inc., working on electromechanical design simulation tools as Vice President until its IPO. This experience inspired him to Co-found and head Opmaxx Inc., a design-for-test IP firm that later merged with Credence Systems.
- Bachelor of Science degree in Electrical Engineering from California Polytechnic State University, San Luis Obispo.
- MBA from the University of Portland, Oregon.
Senior Vice President
As Ridgetop’s Senior Vice President of Product Development, Robert Wagoner is responsible for the manufacturing and production aspects of hardware and software deliverables. An experienced Software/Firmware Engineer with wide-ranging experience in the development of advanced diagnostic and prognostic products,
- California State Polytechnic University, Pomona CA, studied math, programming, analog and digital design
- California Institute of Technology, Pasadena CA, studied advanced math, Assembly and C programming, hardware design
- Wagoner, R., et al., “Prognostic Health Management (PHM) of Electrical Systems Using Condition-based Data for Anomaly and Prognostic Reasoning,” Vol.33, 2013 Chemical Engineering Transactions (AIDIC 2013)
- Wagoner, R., et al., “Prognostic-Enabling of an Electrohydrostatic Actuator (EHA) System,” Annual Conference of the Prognostics and Health Management Society (PHM 2012), Minneapolis, Minnesota, September 2012
- Gleeson, R. Wagoner, N. Kunst, “A Method for Finding Fault-to-Failure Signature in a Set of Data,” U.S. Patent Pending, filed April 4, 2012.
- M. Rounds, N. Kunst, and R. Wagoner, “Method of Network…Using Sentinel Network,” U.S. Provisional Patent filed Nov. 14, 2011.
Dr. Manhaeve leverages his significant experience in the semiconductor industry to provide unique, cost-effective, highly reliable solutions for IC and electronic circuits and systems testing to global semiconductor companies.
Highly knowledgeable in IC and ASIC design, his range of expertise includes: IC testing, test strategy development and improvement, design for test methodologies (SCAN, BIST, and Boundary Scan) and application, fault models, fault grading, test vector generation, ATPG, digital/mixed-signal circuit testing, memory testing, (supply) current-based testing, (supply) current-based design for testing, Iddx monitor design and development for on-chip and off-chip applications, Iddq, Iddt, Iddx, BICS, Iddx application strategies, reliability screens, quality screening, and 0ppm support.
- Ph.D. in Electronics Engineering from University of Hull, UK
- MSc, Electronic Engineering – Microelectronics, KHBO
- Bachelors Degree, Physics, University of Gent – RUG
- Manhaeve, De Pauw, “Method for detecting faults in electronic devices, based on quiescent current measurements” #7,315,974 January 1, 2008
- Manhaeve, Kerckenaere, Straka “Device for monitoring quiescent current of an electronic device” #7,315,180 January 1, 2008
- Manhaeve, Kerckenaere, Straka “Device for monitoring quiescent current of an electronic device” #6,927,592 August 9, 2005
- Manhaeve, Viera “Method and apparatus for testing electronic devices ” #6,859,058 February 22, 2005
- Manhaeve, Kerckenaere, Stopjakova “High resolution (quiescent) supply current system (IDD monitor) ” #6,441,633 August 27, 2002