Q-Star Test Products

Q-Star Test™ is a complete line of affordable precision current measurement modules and intellectual property (IP) for IC testing that:

  • Reduces test time and test cost
  • Improves product quality
  • Improves test quality
  • Accelerates failure analysis

Ridgetop Europe develops and supports the Q-Star Test product line for IDDQ/ISSQ/IDDT and other test methodologies. With successful installations in the semiconductor, automotive, medical control, telecommunications, networking, sensors and transducers, and consumer electronics markets, Q-Star Test products and services can help you bring together the worlds of design and test and properly implement current-based test strategies while saving you time and money.

Integration

Q-Star Test instruments are compatible with all ATE platforms. In particular, “plug-and-play” solutions are in production environments on the following:

  • Verigy V93000 ATE platform
  • Teseda V5xx verification systems
  • Inovys Personal Ocelot and Ocelot test systems (now part of Verigy)
  • Limited libraries available for LTX-Credence (Duo, Quartet) or Teradyne (J750) test systems

Product Family Features

Advanced
Functionality
Socket
ready
Single
Channel
Multi
Channel
Minimal
Size
Low Current
Ranges
High Current
Ranges
Static
Quiescent
Dynamic
Transient
QD-1xxx Lite
QD-1xxxHC Lite
QD-10xx
QD-1xxx
QD-10xxHC
QD-1xxxHC
QT-14xx

Product Briefs

The Q-Star Test™ Product Brief provides a summary of the information below.

Product Briefs for IDDQ/ISSQ Test Measurements

QD-1011-HC

QD-1011-HC

  • QD-1011-HC: Advanced High Current Iddq, Measurement Instrument Supporting Various Test Applications
  • QD-1011-HCLite; Wide Range, High Current, High Performance Digital Iddq, Measurement Instrument
  • QD-1011: Advanced (Delta) Iddq Measurement Instrument Supporting Various Test Applications
  • QD-1011Lite; High Speed, High Resolution Digital Iddq Measurement Instrument
  • QD-1013; Advanced High Voltage Iddq Instrument Supporting Various Test Applications
  • QD-1020-HC: Advanced High Current Multi-site Iddq Measurement Instrument Supporting Various Test Applications
  • QD-1020; Advanced Multi-site Iddq Measurement Instrument Supporting Various Test Applications
  • QD-1030; Advanced (Delta) Issq Measurement Instrument Supporting Various Test Applications
  • QD-1040; Advanced Iddq Instrument with Sense Line Control Supporting Various Measurement Approaches

 Product Briefs for IDDT Test Measurements

QT-1411

QT-1411

  • QT-1411: Advanced Dynamic /Transient (IDDT) Supply Current Measurement Instrument

 Product Briefs for Analog Current Measurement

QA-1000-HC

QA-1000-HC

  • QA-1000-HC: Configurable Analog Supply/Ground Current Measurement Instruments
  • QA-1000: Configurable Analog Supply Current Measurement Instrument

Built-in Current Sensors

BICMON core

BICMON core

  • BICMON: Full Featured Built-in CMOS IDDQ Monitor Core
  • PG-Mon: Built-in CMOS Monitor Core for IC Connection Verification

Selected Webinars

  • Reliability and Precision Current Measurements

Click here to download the webinar presentation (PDF)
Click here to download the audio/video recording of the webinar (MP4)

Related Products

  • For information on how PG-Mon is used for monitoring reliability of 2.5D and 3D stacked ICs, visit the TSV BIST™ page.
  • ProChek™ includes similar Q-Star-class instruments in a highly integrated system.

For more information, please contact us or visit the Ridgetop Europe website at www.ridgetop.eu.