Ridgetop’s PDKChek measures die-level process-induced variations, both random and systematic, in MOS transistor threshold voltage (VT), resistance, capacitance, and turn on/off current. PDKChek is an unobtrusive, stand-alone IP block designed to accurately and precisely measure the variation in parameters resulting from the randomness inherent in die manufacturing and processing. PDKChek, along with the YieldMaxx™ visualization tool, is part of the nanoDFM™ product line.
The PDKChek IP block provides circuit designers with independent verification data to improve the accuracy of process design margins, increase process yield, expedite problem resolution (design- or process-related), reduce design iterations (duration and frequency), and enable shorter time to market.
PDKChek allows for faster testing than traditional scribe-line transistors. Testing can take place before or after packaging the die. Die-level testing takes advantage of test structures and bonding pads that are already present on the die, so there is no additional error introduced by the contact resistance of a probe station.
For more information, contact us directly, or follow the links below.
Overviews & Catalogs
- PDKChek™ Independent Die-Level Monitor
- YieldMaxx™ Design for Manufacturing Die-Level Process Monitor (DLPM) Data Analysis Tool