- Improved Reliability-based Decision Support Methodology Applicable in System-level Failure Diagnosis and Prognosis [October 2014 IEEE Transactions on Aerospace and Electronic Systems, Volume 50 Issue 4]
- Evaluation of MEMS-Based Wireless Accelerometer Sensors in Detecting Gear Tooth Faults in Helicopter Transmissions
- A Model-based Avionic Prognostic Reasoner (MAPR)
- Prognostic-Enabling of an Electrohydrostatic Actuator (EHA) System
- Uptime Improvements for Photovoltaic Power Inverters
- Fault Classification with Gauss-Network Optimization and Real-Time Simulation
- Pattern Analysis in Real Time with Smart Power Sensor
- A Prognostics Approach for Electronic Damage Propagation and Analysis in Electromechanical Actuator Systems
- Autonomic Integrated Prognostics Health Management Systems: Concepts and Designs
- Adaptive Remaining Useful Life Esitmator (ARULE)
- A Sensor for Real-Time Detection of Solder-Joint Faults in Operational Field Programmable Gate Arrays
- Ball Grid Array (BGA) Solder Joint Intermittency Detection: SJ BIST
- Intermittency Detection and Mitigation In Ball Grid Array (BGA) Packages
- Real-Time Detection of Solder-Joint Faults in Operational Field Programmable Gate Arrays
- Damage Propagation Analysis Methodology for Electromechanical Actuator Prognostics
- An Innovative Approach to Electromechanical Actuator Emulation and Damage Propagation Analysis
- Statistical Pattern Recognition and Built-In Reliability Test for Feature Extraction and Health Monitoring Of Electronics Under Shock Loads
- Return-on-Investment (ROI) for Electronic Prognostics in High Reliability Telecom Applications
- A Board-Level Prognostic Monitor for MOSFET TDDB
- Return-On-Investment (ROI) For Electronic Prognostics in Mil/Aero Systems
- Practical Application of PHM/Prognostics to COTS Power Converters
- Optimal Maintenance Policies Under Changing Technology and Environment
- Non-invasive Prognostication of Switch Mode Power Supplies with Feedback Having Gain
- New Drain Current Model for Nano-Meter MOS Transistors On-Chip Threshold Voltage Test, Jinbo Wan and Hans G. Kerkhoff, T. U. Twente, European Test Symposium 2015
- In-situ Sensors for Product Reliability Monitoring
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